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Gewählte Publikation:

Stingeder, G..
(1994): Optimization of secondary ion mass spectrometry for quantitative trace analysis.
Analytica Chimica Acta, 297, p. 231

Abstract:

The potential of dynamic secondary ion mass spectrometry (SIMS) for quantitative trace analysis is evaluated from the basic equations of signal formation and instrumental detection. The key factors are sputtering yield and ionization probability. The aim

Autor*innen der BOKU Wien:

Stingeder Gerhard Josef

Find related publications in this database (Keywords)

MASS SPECTROMETRY

SECONDARY ION MS

TRACE ANALYSIS