Originalbeitrag in Fachzeitschrift
Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity
Doolette C, Howard D, Afshar N, Kewish C, Paterson D, Huang J, et al. Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity. Analytical Chemistry. 2022;94(11):4584-93. doi:https://doi.org/10.1021/acs.analchem.1c04255
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BOKU Autor*innen
Walter Wenzel
Univ.Prof. Dipl.-Ing. Dr.nat.techn. Walter Wenzel
Jakob Santner
Priv.-Doz. Dipl.-Ing. Dr.nat.techn. Jakob Santner
Stefan Wagner
Stefan Wagner M.Sc.